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Heading to DAC 2025 with Thine: Advanced Verification Solutions for ICs to Ensure High Quality Amid PVT Variations

At the center of modern communication systems lies a critical component: the phase interpolator (PI). This relatively tiny component plays…

Siemens’ Solido Custom IC and TSMC Collaborate to Enable Advanced Process Node Verification

After an extensive qualification process, Analog FastSPICE (AFS), part of Solido™ Simulation Suite, has achieved certification for TSMC’s N2P and…

Heading to DAC 2025 with Microsoft: Novel TRNG Verification with a High-Performance Simulation Methodology

In our data-driven world, the need for robust security solutions continues to grow. At the heart of modern cryptographic systems…

Reflections from Siemens EDA User2User Forum in Noida

I recently had the privilege of representing the Solido Custom IC (CIC) team at the Siemens EDA User2User Forum 2025…

Achieving Automotive Functional Safety Compliance with ISO 26262 Certified Solido Custom IC Solutions

As the automotive industry rapidly evolves, with the rise of autonomous driving, electrification, and advanced driver-assistance systems (ADAS), the need…

The Crucial Role of Full-Spectrum Transient Noise Analysis for Silicon Success

The Crucial Role of Full-Spectrum Transient Noise Analysis for Silicon Success

As chips continue to push the boundaries of performance, ensuring first time silicon success has never been more critical. For…

Inside Microsoft’s Journey to Transform IP QA with Solido IP Validation Suite

Picture a world-renowned band stepping on stage for a highly anticipated concert. The lights dim, the crowd roars, and then—chaos….

Transform Your IP Selection Process with Solido Library Profiler

At the heart of every breakthrough technology lies intellectual property (IP), powering everything from cutting-edge System-on-Chips (SoCs) to specialized Application-Specific…

Enhancing SRAM Yield Prediction with Solido’s AI-Powered Technologies

In the ever-evolving world of semiconductor technology, predicting and enhancing the yield of Static Random Access Memory (SRAM) has always…